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Analysis

High Resolution Scanning Electron Microscopy Scanning Electron Microscopy
(SEM) / FIB

 

  • 6-axis sample stage accepts a variety of different sizes/shapes.
  • FIB used for in situ sectioning/milling of samples during imaging.
  • Osmium plasma coating protects non-conductive samples from charging and beam damage.


 

Energy Dispersive X-Ray Spectroscopy / Elemental Mapping

  • SEM/FIB is paired with an EDX system to provide in situ elemental mapping during imaging.


 

Atomic Force Microscopy

Picture5 - Atomic Force Microscopy

  • High resolution imaging in Contact, Tapping, and Lateral (friction) mode.
  • Typical sample size is 1 cm x 1 cm. Please inquire about large area scanning.


 

Large Area 2D/3D Stylus Profilometry

  • Large area (up to 150 mm scan length) 2D and 3D imaging with 1 mm z-range.
  • Typically used for step-height measurements, surface roughness, and surface waviness.


 

Ellipsometry

  • Non-contact, variable angle ellipsometer.
  • Lasers perform in the 370 nm – 1700 nm range down to a 150 mm spot size.

 

All of our analytical services can be requested using a simple Request for Quotation form.